Electron Microscopy and Diffraction Analysis of Materials detailed syllabus for Materials Science & Engineering (MSE) for 2019 regulation curriculum has been taken from the Anna Universities official website and presented for the MSE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below.
For Materials Science & Engineering 6th Sem scheme and its subjects, do visit MSE 6th Sem 2019 regulation scheme. For Professional Elective-II scheme and its subjects refer to MSE Professional Elective-II syllabus scheme. The detailed syllabus of electron microscopy and diffraction analysis of materials is as follows.
Course Objective:
For the complete syllabus, results, class timetable, and many other features kindly download the iStudy App
It is a lightweight, easy to use, no images, and no pdfs platform to make students’s lives easier.
.
Unit I
Basics of Crystallography and Electron Optics
Introduction – Electron Optics – microscopy and the concept of resolution – interaction of electrons with matter – depth of field and depth of focus, crystallography – symmetry elements -symmetry operations, point groups, space groups, indexing planes, indexing lattice directions -plane normals – zones and the zone law, stereographic projection -Wulff Net
Unit II
For the complete syllabus, results, class timetable, and many other features kindly download the iStudy App
It is a lightweight, easy to use, no images, and no pdfs platform to make students’s lives easier..
Unit III
Transmission Electron Microscopes
Working principle of TEM – important aspects of microscope operation and alignment -aberration correction – resolution, calibration – formation of diffraction patterns and images -SAED – bright and dark field images – Centered dark field images – weak beam images -sample preparation, advanced TEMs – HRTEM
Unit IV
For the complete syllabus, results, class timetable, and many other features kindly download the iStudy App
It is a lightweight, easy to use, no images, and no pdfs platform to make students’s lives easier..
Unit V
Scanning Electron Microscopes
Working principles of SEM, depth of field and focus, interaction volume, secondary electrons, backscattered electrons, Spectroscopy – Energy Dispersive X-ray spectroscopy – wavelength dispersive X-ray spectroscopy – Electron energy loss spectroscopy, microscope operation -imaging – sample preparation, advanced SEMs – Scanning Transmission Electron Microscope (STEM)- Electron backscattered diffraction -Orientation Imaging.
Course Outcome:
For the complete syllabus, results, class timetable, and many other features kindly download the iStudy App
It is a lightweight, easy to use, no images, and no pdfs platform to make students’s lives easier..
Text Books:
- David B. Williams and C. Barry Carter, “Transmission Electron Microscopy: A Text Book for Materials Science”, Springer, 2009.
- Peter J. Goodhew, John Humphreys, Richard Beanland, “Electron Microscopy and Analysis”, 3rd Edition, CRC Press, 2000.
References:
- Dale E. Newbury, David C. Joy and E.Charles, “Scanning Electron Microscopy and X-ray Microanalysis”, Springer Science, New York, 2003.
- J. W. Edington, “Electron Diffraction in the Electron Microscope”, N. V.Philips” Gloeilampenfabrieken, Eindhoven, 1975.
- Marc De Graef, “Introduction to Conventional Transmission Electron Microscopy”, Cambridge University Press, UK, 2003.
For detailed syllabus of all the other subjects of Materials Science & Engineering 6th Sem, visit MSE 6th Sem subject syllabuses for 2019 regulation.
For all Materials Science & Engineering results, visit Anna University MSE all semester results direct link.