Electron Microscopy detailed syllabus for Materials Science & Engineering (MSE) for 2021 regulation curriculum has been taken from the Anna Universities official website and presented for the MSE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below.
For Materials Science & Engineering 5th Sem scheme and its subjects, do visit MSE 5th Sem 2021 regulation scheme. For Professional Elective-I scheme and its subjects refer to MSE Professional Elective-I syllabus scheme. The detailed syllabus of electron microscopy is as follows.
Course Objectives:
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Unit I
ELECTRON BEAM AND MATERIAL INTERACTION 9
Electron gun – types – thermo-emission and field emission – electromagnetic and magnetic lens -aberration – corrections – electron material interaction – elastic and inelastic – signals – escape depth
Unit II
SCANNING ELECTRON MICROSCOPY 9
Imaging modes – resolution – depth of field and depth of focus – contrast – number contrast -compositional contrast – Influence of process parameters on image fractography- applications
Unit III
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Unit IV
ELECTRON DIFFRACTION 9
Reciprocal lattice- Stereographic projection – Selected Area Electron Diffraction – Zone axis, indexing – Structure Factor – Typical patterns of BCC, FCC and HCP – Kikuchi pattern – SEM -Orientation Imaging – Electron Backscattered Diffraction (EBSD).
Unit V
ADVANCED ELECTRON MICROSCOPY 9
Field ion microscopy (FIB), Low Energy Electron Diffraction (LEED), Reflection High Energy Electron Diffraction (RHEED).
Course Outcomes:
Upon Completion of the course, the students will be able to
- Explain the interaction between electron beam and materials
- Interpret the images obtained from scanning electron microscopy
- Discuss on the working principle of transmission electron microscopy
- Identify the electron diffraction patterns and interpret them
- Describe the different advanced electron microscopic techniques
Text Books:
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Reference Books:
- J. W. Edington, “Electron Diffraction in the Electron Microscope”, N. V. Philips’ Gloeilampenfabrieken, Eindhoven, 1975.
- Joseph Goldstein, Dale Newbury, David Joy, et al., “Scanning Electron Microscopy and X-ray Microanalysis”, Kluwer Academic / Plenum Publishers, New York, 2003.
- Marc De Graef, “Introduction to Conventional Transmission Electron Microscopy”, Cambridge University Press, UK, 2003.
For detailed syllabus of all the other subjects of Materials Science & Engineering 5th Sem, visit MSE 5th Sem subject syllabuses for 2021 regulation.
For all Materials Science & Engineering results, visit Anna University MSE all semester results direct link.