Metrology and Measurements detailed syllabus for Electronics & Instrumentation Engineering (EIE) for 2019 regulation curriculum has been taken from the Anna Universities official website and presented for the EIE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below.
For Electronics & Instrumentation Engineering 8th Sem scheme and its subjects, do visit EIE 8th Sem 2019 regulation scheme. For Professional Elective-VII scheme and its subjects refer to EIE Professional Elective-VII syllabus scheme. The detailed syllabus of metrology and measurements is as follows.
Course Objective:
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Unit I
Basics of Metrology
Measurement – Need, Process, Role in quality control; Factors affecting measurement – SWIPE; Errors in Measurements – Types – Control – Measurement uncertainty – Types, Estimation, Problems on Estimation of Uncertainty, Statistical analysis of measurement data, Measurement system analysis, Calibration of measuring instruments, ISO standards.
Unit II
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Unit III
Tolerance Analysis
Tolerancing – Interchangeability, Selective assembly, Tolerance representation, Terminology, Limits and Fits, Problems (using tables); Design of Limit gauges, Problems. Tolerance analysis in manufacturing, Process capability, tolerance stackup, tolerance charting.
Unit IV
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Unit V
Advances in Metrology
Lasers in metrology – Advantages of lasers – Laser scan micrometers; Laser interferometers -Applications – Straightness, Alignment; Ball bar tests, Computer Aided Metrology – Basic concept of CMM – Types of CMM – Constructional features – Probes – Accessories – Software -Applications – Multisensor CMMs. Machine Vision – Basic concepts of Machine Vision System – Elements – Applications – On-line and in-process monitoring in production – Computed tomography – White light Scanners.
Course Outcome:
For the complete syllabus, results, class timetable, and many other features kindly download the iStudy App
It is a lightweight, easy to use, no images, and no pdfs platform to make students’s lives easier..
Text Books:
- Dotson Connie, “Dimensional Metrology”, Cengage Learning, First edition, 2012.
- Mark Curtis, Francis T. Farago, “Handbook of Dimensional Measurement”, Industrial Press, Fifth edition, 2013.
References:
- AmmarGrous, J “Applied Metrology for Manufacturing Engineering”, Wiley-ISTE, 2011.
- Galyer, J.F.W. Charles Reginald Shotbolt, “Metrology for Engineers”, Cengage Learning EMEA; 5th revised edition, 1990.
- National Physical LaboratoryGuideNo. 40, No. 41, No. 42, No. 43, No. 80, No. 118, No. 130, No. 131. http://www.npl.co.uk. (relevant to syllabus).
- Raghavendra N.V. and Krishnamurthy. L., Engineering Metrology and Measurements, Oxford University Press, 2013.
- Venkateshan, S. P., “Mechanical Measurements”, Second edition, John Wiley &Sons, 2015.
For detailed syllabus of all the other subjects of Electronics & Instrumentation Engineering 8th Sem, visit EIE 8th Sem subject syllabuses for 2019 regulation.
For all Electronics & Instrumentation Engineering results, visit Anna University EIE all semester results direct link.