5th Sem, MANF

Engineering Metrology Manf 5th Sem Syllabus for BE 2017 Regulation Anna Univ

Engineering Metrology detail syllabus for Manufacturing Engineering (Manf), 2017 regulation is taken from Anna University official website and presented for students of Anna University. The details of the course are: course code (MF8503), Category (PC), Contact Periods/week (3), Teaching hours/week (3), Practical Hours/week (0). The total course credits are given in combined syllabus.

For all other manf 5th sem syllabus for be 2017 regulation anna univ you can visit Manf 5th Sem syllabus for BE 2017 regulation Anna Univ Subjects. The detail syllabus for engineering metrology is as follows.”

Course Objective:

  • To teach the students basic concepts in various methods of engineering measurement techniques and applications, understand the importance of measurement and inspection in manufacturing industries.
  • Expose the students to various modern metrological instruments and the procedure used to operate these instruments.

Unit I

For complete syllabus and results, class timetable and more pls download iStudy. Its a light weight, easy to use, no images, no pdfs platform to make students life easier.

Unit II

Linear and Angular Measurements
Measurement of Engineering Components – Comparators, Slip gauges, Rollers, Limit gauges -Design and Applications – Angle dekkor – Alignment telescope – Sine bar – Bevel protractors -Types
– Principle – Applications.

Unit III

Form Measurements
Measurement of Screw thread and gears – Radius measurement – Surface finish measurement -Auto collimator – Straightness, Flatness and roundness measurements – Principles – Application.

Unit IV

For complete syllabus and results, class timetable and more pls download iStudy. Its a light weight, easy to use, no images, no pdfs platform to make students life easier.

Unit V

Advances in Metrology
Co-ordinate measuring machine – Constructional features – Types – Applications of CMM – CNC CMM applications – Computer Aided Inspection – Machine Vision – Applications in Metrology. Nanometrology – Introduction – Principles – Nanometer metrology systems – Methods of measuring length and surfaces to nano scale result with interferometers and other devices

Course Outcome:

  • Upon completion of this course, the students can able to demonstrate different measurement technologies and use of them in Industrial Components

Text Books:

  1. Gaylor, Shotbolt and Sharp, “Metrology for Engineers, 5th Edition, O.R.Cassel, London, 1993.
  2. Jain. R.K., “Engineering Metrology, 19th Edition, Khanna Publishers, 2005

References:

  1. Thomas, Engineering Metrology, Butthinson and Co., 1984.
  2. Graham T. Smith, Industrial Metrology, Springer-Verlag London Ltd, 2002
  3. White house, D. J, Handbook of Surface and Nanometrology, The Institute of Physics, London, 1994.
  4. Mahajan.M., A text-Book of Metrology, Dhanpat Rai and Co. (P) Ltd., 2006

For detail syllabus of all other subjects of BE Manf, 2017 regulation do visit Manf 5th Sem syllabus for 2017 Regulation.

Dont forget to download iStudy for latest syllabus and results, class timetable and more.

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