Characterization of Materials detail syllabus for Materials Science And Engineering (Material Science), 2017 regulation is taken from Anna University official website and presented for students of Anna University. The details of the course are: course code (ML8503), Category (PC), Contact Periods/week (3), Teaching hours/week (3), Practical Hours/week (0). The total course credits are given in combined syllabus.
For all other material science 5th sem syllabus for be 2017 regulation anna univ you can visit Material Science 5th Sem syllabus for BE 2017 regulation Anna Univ Subjects. The detail syllabus for characterization of materials is as follows.”
Course Objective:
- Characterisation of materials is very important for studying the structure of materials and to interpret their properties. The students study the theoretical foundations of metallography, X-ray diffraction, electron diffraction, scanning and transmission electron microscopy as well as surface analysis.
Unit I
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Unit II
X-Ray Diffraction Techniques
Crystallography basics, reciprocal lattice, X-ray generation, absorption edges, characteristic spectrum, Braggs law, Diffraction methods – Laue, rotating crystal and powder methods. Stereographic projection. Intensity of diffracted beams – structure factor calculations and other factors. Cameras- Laue, Debye-Scherer cameras, Seeman – Bohlin focusing cameras. Diffractometer – General feature and optics, proportional, Scintillating and Geiger counters.
Unit III
Analysis of X-Ray Diffraction
Line broadening, particle size, crystallite size, Precise parameter measurement, Phase identification, phase quantification, Phase diagram determination X-ray diffraction application in the determination of crystal structure, lattice parameter, residual stress – quantitative phase estimation, ASTM catalogue of Materials identification.
Unit IV
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Unit V
Principle and Applications
Surface chemical composition- Mass spectroscopy and X-ray emission spectroscopy (Principle and limitations) – Energy Dispersive Spectroscopy- Wave Dispersive Spectroscopy- Quadrapole mass spectrometer. Electron spectroscopy for chemical analysis (ESCA), Ultraviolet Photo Electron Spectroscopy (UPS), X ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Electron Energy Analysers, Secondary ion mass spectrometry -Applications. Unit meshes of five types of surface nets – diffraction from diperiodic structures using electron, Low Energy Electron Diffraction (LEED), Reflection High Energy Electron Diffraction (RHEED)-TGA.
Course Outcome:
- Able to understand the physics behind the various metallographic techniques.
- Ability to describe the principle, construction and working of XRD techniques
- Ability to analysis the X-ray diffraction data
- Ability to describe the principle, construction and working of electron microscopy.
- Ability to identify the appropriate spectroscopy technique for required information.
Text Books:
- Cullity, B. D., Elements of X-ray diffraction, 3rd Edition, Addison-Wesley Company Inc., New York, 2000
- Phillips V A, Modern Metallographic Techniques and their Applications, Wiley Eastern,1971.
References:
- Brandon D. G, Modern Techniques in Metallography, Von Nostrand Inc. NJ, USA,1986.
- D. A. Skoog, F. James Leary and T. A. Nieman, Principles of Instrumental Analysis, Fifth Edition, Saunders Publishing Co., 1998
- Haines, P.J., Principles of Thermal Analysis and Calorimetry, Royal Society of Chemistry (RSC), Cambridge, 2002.
- Thomas G., Transmission electron microscopy of metals, John Wiley, 1996.
- Weinberg, F., Tools and Techniques in Physical Metallurgy, Volume I and II, Marcel and Decker, 1970.
- Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation, Nineth Edition, ASM international, USA, 1986.
For detail syllabus of all other subjects of BE Material Science, 2017 regulation do visit Material Science 5th Sem syllabus for 2017 Regulation.
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