Characterization of Materials Syllabus for B.Tech 5th sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Characterization of Materials B.Tech (R13) fifthsem is as follows
OBJECTIVES:
Characterisation of materials is very important for studying the structure of materials and to interprettheir properties. The students study the theoretical foundations of metallography, X- ray diffraction, electron diffraction, scanning and transmission electron microscopy as well as surface analysis
UNIT I : METALLOGRAPHIC TECHNIQUES [8 Hours]
Macro examination – applications, metallurgical microscope – principle, construction and working, metallographic specimen preparation, optic properties – magnification, numerical aperture, resolving power, depth of focus, depth of field, different light sources lenses aberrations and their remedial measures, various illumination techniques-bright field , dark field, phase contrast polarized light illuminations, interference microscopy, high temperature microscopy; quantitative metallography – Image analysis
UNIT II : X-RAY DIFFRACTION TECHNIQUES [10 Hours]
Crystallography basics, reciprocal lattice, X-ray generation, absorption edges, characteristic spectrum, Bragg’s law, Diffraction methods – Laue, rotating crystal and powder methods. Stereographic projection. Intensity of diffracted beams – structure factor calculations and other factors. Cameras- Laue, Debye-Scherer cameras, Seeman – Bohlin focusing cameras. Diffractometer – General feature and optics, proportional, Scintillating and Geiger counters.
UNIT III : ANALYSIS OF X-RAY DIFFRACTION [9 Hours]
Line broadening, particle size, crystallite size, Precise parameter measurement, Phase identification, phase quantification, Phase diagram determination X-ray diffraction application in the determination of crystal structure, lattice parameter, residual stress – quantitative phase estimation, ASTM catalogue of Materials identification-
[TOTAL: 45 PERIODS]
OUTCOMES:
Ability to perform analysis of X ray diffraction and electon microscope images and the chemical and thermal analysis datas.
TEXT BOOKS:
- Cullity, B. D.,“ Elements of X-ray diffraction”, 3rd Edition, Addison-Wesley Company Inc., New York, 2000
- Phillips V A, “Modern Metallographic Techniques and their Applications”, Wiley Eastern,1971.
REFERENCES:
- Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA,1986.
- Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996.
- Weinberg, F., “Tools and Techniques in Physical Metallurgy”, Volume I & II, Marcel and Decker, 1970.
- Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation“, Nineth Edition, ASM international, USA, 1986.
- Haines, P.J.,“ Principles of Thermal Analysis and Calorimetry”, Royal Society of
Chemistry (RSC), Cambridge, 2002. - D. A. Skoog, F. James Leary and T. A. Nieman, “Principles of Instrumental Analysis”, Fifth Edition, Saunders Publishing Co., 1998
For all other B.Tech ML 5th sem syllabus go to Anna University B.Tech MATERIAL SCIENCE AND ENGINEERING (ML) 5th Sem Course Structure for (R13) Batch.All details and yearly new syllabus will be updated here time to time. Subscribe, like us on facebook and follow us on google plus for all updates.
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