Electronic Testing for B.Tech 7th sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Electronic Testing B.Tech (R13) seventhsem is as follows
OBJECTIVES:
- To understand the basics of testing and the testing equipments
- To understand the different testing methods
UNIT I : INTRODUCTION [9 hours]
Test process and automatic test equipment, test economics and product quality, fault modeling
UNIT II : DIGITAL TESTING [9 hours]
Logic and fault simulation, testability measures, combinational and sequential circuit test generation.
UNIT III : ANALOG TESTING [9 hours]
Memory Test, DSP Based Analog and Mixed Signal Test, Model based analog and mixed signal test, delay test, IIDQ test.
TOTAL: 45 PERIODS
OUTCOMES: Upon completion of the course, students
- Explain different testing equipments.
- Design the different testing schemes for a circuit.
- Discuss the need for test process
TEXT BOOK:
- Michael L. Bushnell and Vishwani D. Agarwal, “Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits”, Springer, 2006.
REFERENCE:
- Dimitris Gizopouilos , “Advances in Electronic Testing” , Springer 2006.
For all other B.Tech EEE 7th sem syllabus go to Anna University B.Tech ELECTRICAL AND ELECTRONICS ENGINEERING (EEE) 7th Sem Course Structure for (R13) Batch.All details and yearly new syllabus will be updated here time to time. Subscribe, like us on facebook and follow us on google plus for all updates.
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