Computer Aided Inspection detailed syllabus for Mechanical & Automation Engineering (MAE) for 2021 regulation curriculum has been taken from the Anna Universities official website and presented for the MAE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below.
For Mechanical & Automation Engineering 5th Sem scheme and its subjects, do visit MAE 5th Sem 2021 regulation scheme. For Professional Elective-III scheme and its subjects refer to MAE Professional Elective-III syllabus scheme. The detailed syllabus of computer aided inspection is as follows.
Course Objectives:
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Unit I
OPTICAL DIMENSIONAL METROLOGY 9
Basic to advanced metrology evolution, Optical dimensional metrology of precision features – Machine vision, Laser Tracking Systems, Laser scanners, White-Light Interference 3D Microscopes, Focus variation based Optical Metrology- Fringe projection method.
Unit II
ADVANCES IN SURFACE METROLOGY 9
Surface Geometry and Its Importance in Function, Surfaces and Manufacture, Filtering – Gaussian, 2RC, Advanced Filters, Surface finish parameters – Amplitude, Spacing, Hybrid, Shape, Autocorrelation, Power Spectral Density, Bearing Area.3D areal and parametric measurement, Need for 3D surface topography measurement, Stylus instruments, Optical Instruments – Chromatic confocal Microscopy, Interferometry, Non-optical Scanning Microscopy – Scanning electron Microscopes, Scanning probe microscopes, Parameters for characterizing 3D surface topography.
Unit III
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Unit IV
METROLOGY OF MACHINE TOOLS 9
Sources of error, Principles of measurement, Errors due to machine elements, bearings, spindles, Kinematic design, Structural compliance. Vibration, Thermal errors – background, thermal effects, Environmental control of precision machinery. Error mapping and error budgets.
Unit V
NANOMETROLOGY 9
Precision to Nanometrology, Optical Micro-Metrology of Small Objects – White-Light Interference 3D Microscopes, Focus-Based Optical Metrology- Fringe projection method, Measurement of Typical Nanofeatures, Measuring Length to Nanoscale with Interferometers and Other Devices, Nano Geometry in Macro Situations.
Course Outcomes:
At the end of the course the students would be able to
- Describe the working principle and applications of optical measuring instruments.
- Apply advanced surface finish measurement techniques in manufacturing process analysis.
- Analyse the performance of CMMs for measurement applications.
- Explain the errors involved in precision machine tools and calculate the error budgets for a given situation.
- Outline the principles and methods of nanometrology.
Text Books:
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Reference Books:
- AmmarGrous,J“AppliedMetrologyforManufacturingEngineering”,Wiley-ISTE,2011.
- DotsonConnie,“DimensionalMetrology”,CengageLearning,Firstedition,2012.
- MarkCurtis,FrancisT.Farago,“Handbook of Dimensional Measurement”,IndustrialPress,Fifthedition, 2013.
- Toru Yoshizawa, “Handbook of Optical Metrology: Principles and Applications”, CRC Press, 2009.
- Robert J. Hocken and Paulo H. Pereira, Coordinate measuring machines and systems, 2nd Edition, CRC press, 2012.
For detailed syllabus of all the other subjects of Mechanical & Automation Engineering 5th Sem, visit MAE 5th Sem subject syllabuses for 2021 regulation.
For all Mechanical & Automation Engineering results, visit Anna University MAE all semester results direct link.