Test Engineering detail TNDTE Diploma syllabus for Electronics And Communication Engineering (EC), M scheme is extracted from TNDTE official website and presented for diploma students. The course code (34062), and for exam duration, Teaching Hr/week, Practical Hr/week, Total Marks, internal marks, theory marks, duration and credits do visit complete sem subjects post given below. The syllabus PDFs can be downloaded from official website.
For all other electronics 6th sem syllabus for diploma m scheme tndte you can visit Electronics 6th Sem Syllabus for Diploma M Scheme TNDTE Subjects. The detail syllabus for test engineering is as follows.
Rationale:
Unit 1
Introduction To Test Engineering.
Need and Importance of Test Engineering – Principles of Fundamental Testing Methods – Basic Principles of Memory Testing – PCB Track Short Testing Methods -Concepts of Trouble Shooting PCBs – Manual and Automated PCB Trouble Shooting Techniques. 17
Unit 2
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Unit 3
V-I(Signature) TESTING METHODS AND TECHNOLOGY
Fundamentals of Electrical Characteristics – Effects of Curve Trace, Characteristics of Passive and Active Components -Understanding Composite VI-Curve and it deviations -Component Identification of Ageing Effects with VI Curve Trace, Input and Output Characteristics of Digital Integrated Circuits -Good Versus Suspect interpretation Comparison. 15
Unit 4
Boundary Scan Testing Methods And Technology
Introduction to Boundary Scan – Need of Boundary Scan Test Technique – Principle of Boundary Scan Test – Boundary Scan Architecture – Application of Boundary Scan Test- Boundary Scan Standards – Boundary Scan Description Language (BSDL) -Interconnect test – Serial Vector Format (SVF) Test – Basic of JTAG Port – Digital Integrated Circuit Test using Boundary Scan Techniques. 15
Unit 5
For complete syllabus and results, class timetable and more pls download iStudy Syllabus App. It’s a lightweight, easy to use, no images, no pdfs platform to make students life easier.
Reference Books:
- Test Engineering for Electronic Hardware – S R Sabapathi, Qmax Test Equipments P Ltd., 2011.
- Practical Electronic Fault Finding and Trouble shooting by Robin Pain Newnes, Reed Educational and professional publishing Ltd., 1996
- The Fundamentals of Digital Semiconductor Testing, Floyd, Pearson Education India, Sep-2005
For detail syllabus of all other subjects of BE Electronics, M scheme do visit Electronics 6th Sem syllabus for M scheme.
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