Materials Characterization Techniques Detailed Syllabus for B.Tech third year first sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Materials Characterization Techniques B.Tech 2016-2017 (R16) third year first sem is as follows.
B.Tech. III Year I Sem. L/T/P/C
Course Code: MM511OE 3/0/0/3
Course Objective: This course is intended to give an exposure to evaluation of special characteristics of materials (Structural, Mechanical & Thermal etc.) in order to understand their suitability in Engineering Applications
Course Outcome: At the end of the course the student will be able to characterize, identify, and apply the material to the concerned application.
UNIT-I : X-Ray Diffraction: Introduction, Production and properties of x-rays, Bragg’s law of
diffraction. Experimental Methods of Diffraction, Intensity of Diffracted beams – Scattering by an electron by an atom, by a unit cell, structure-factor calculations; factors affecting Diffraction Intensities.
Application of XRD: Orientation of single crystals, Effect of plastic deformation, the structure of polycrystalline Aggregates, Determination of crystal structure, Precise lattice parameter measurements, Phase – diagram determination, Order-disorder transformation, Chemical analysis by Diffraction, Stress measurement
UNIT-II : Elements of Quantitative Metallography and Image Processing. Scanning Electron Microscopy: Principle, Interaction of electron beams with matter, Construction and Working principle Scanning Electron Microscopy, Working Distance, Depth of field, Depth of focus and Spot Size, Specimen preparation for Scanning Electron Microscopy, Different types of modes used in Scanning Electron Microscopy (Secondary Electron and Backscatter Electron) and their applications, Advantages, limitations and applications of Scanning Electron Microscopy, Electron Backscattered Diffraction.
UNIT-III: Transmission Electron Microscopy: Principle, Construction and Working principle of
Transmission Electron Microscopy, Resolving power and Magnification, Depth of field and Depth of focus, Bright and dark field, Specimen preparation for the Transmission Electron Microscopy: Selected Area Diffraction, Applications of Transmission Electron Microscopy, Advantage and Limitations of Transmission Electron Microscopy.
TEXT BOOKS:
- Material Characterization: Introduction to Microscopic and Spectroscopic Methods – Yang Leng – John Wiley & Sons (Asia) Pvt. Ltd. 2008
- Microstructural Characterization of Materials – David Brandon, Wayne D Kalpan, John Wiley & Sons Ltd., 2008.
REFERENCES:
- Fundamentals of Molecular Spectroscopy – IV Ed. – Colin Neville Banwell and Elaine M. McCash, Tata McGraw-Hill, 2008.
- Elements of X-ray diffraction – Bernard Dennis Cullity & Stuart R Stocks, Prentice Hall , 2001 – Science
For all other B.Tech 3rd Year 1st Sem syllabus go to JNTUH B.Tech Metallurgical and Materials Engineering 3rd Year 1st Sem Course Structure for (R16) Batch.
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