5th Sem, Nano

Characterization Techniques Nano 5th Sem Syllabus for VTU BE 2017 Scheme

Characterization Techniques detail syllabus for Nanoelectronics (Nano), 2017 scheme is taken from VTU official website and presented for VTU students. The course code (17NT53), and for exam duration, Teaching Hr/week, Practical Hr/week, Total Marks, internal marks, theory marks, duration and credits do visit complete sem subjects post given below.

For all other nano 5th sem syllabus for be 2017 scheme vtu you can visit Nano 5th Sem syllabus for BE 2017 Scheme VTU Subjects. The detail syllabus for characterization techniques is as follows.

Course Objectives:

  • To study the basic characterization tools and techniques.
  • To understand the structural, morphological, and surface composition of nano materials.
  • To understand the electrical measurement devices.

Module 1:

For complete syllabus and results, class timetable and more pls download iStudy. Its a light weight, easy to use, no images, no pdfs platform to make students life easier.

Module 2:

X-RAY BASED CHARACTERIZATION: Basic Principles Instrumentation and applications of X-ray diffraction, powder (polycrystalline) and single crystalline XRD techniques; Debye-Scherrer equation. X-ray photoelectron spectroscopy – basic principle, instrumentation, X-ray absorption techniques: introduction to XANES, and EXAFS 10

Module 3:

ELECTRON MICROSCOPY TECHNIQUES: Principles and applications of Electron beam, Electron beam interaction with matter. Scanning electron microscopy: working principle and application. Transmission electron microscopy: introduction, working and application. Electron-diffraction, introduction to SAED. Atomic Force Microscope: working and types of operating modes. Scanning Tunnelling Microscope: working principle and applications. 10

Module 4:

For complete syllabus and results, class timetable and more pls download iStudy. Its a light weight, easy to use, no images, no pdfs platform to make students life easier.

Module 5:

ELECTRICAL MEASUREMENTS: Introduction to Potentiometry. Basics of Voltammetric techniques: Linear and Cyclic voltammetry. IV, AC and DC electric measurements. Impedence Measurement and analysis. 10

Course Outcomes:

After completion of this subject, students will be able to understand and apply the knowledge of:

  • Basics of characterization techniques
  • X-ray based characterization
  • Electron microscopy techniques
  • Spectroscopic techniques
  • Electrical measurements

Graduate Attributes (as per NBA):

  • Engineering Knowledge.
  • Problem Analysis.
  • Design / development of solutions (partly).
  • Interpretation of data.

Question paper pattern:

  • The question paper will have ten questions.
  • Each full Question consisting of 20 marks
  • There will be 2 full questions (with a maximum of four sub questions) from each module.
  • Each full question will have sub questions covering all the topics under a module.
  • The students will have to answer 5 full questions, selecting one full question from each module.

Text Books:

  1. Characterization of Nanostructure materials by XZ.L.Wang
  2. Nanomaterial Characterization, Naveen Kumar Jagadapura Ramegowda, Prasad Puthiyillam, LAP-Lambert Academic Publishing, Mauritius, 2018, ISBN: 978-3-330-34221-7
  3. Instrumental Methods of Analysis, 7th edition- Willard, Merritt, Dean, Settle

Reference Books:

  1. X-Ray Diffraction Procedures: For Polycrystalline and Amorphous Materials, 2nd Edition -Harold P. Klug, Leroy E. Alexander
  2. Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set)- David B. Williams and C. Barry Carter
  3. Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM – Ray F. Egerton

For detail syllabus of all other subjects of BE Nano, 2017 scheme do visit Nano 5th Sem syllabus for 2017 scheme.

Dont forget to download iStudy for latest syllabus and results, class timetable and more.

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