Electronics Equipment Testing detail syllabus for Electronics Engineering, effective from 2017, is collected from BTEUP 2017 Syllabus official website and presented for diploma students. The course details such as exam duration, Teaching Hr/week, Practical Hr/week, Total Marks, internal marks, theory marks, duration and credits do visit complete sem subjects post given below.
For all other electronics eng 6th sem bteup diploma syllabus 2017 you can visit Electronics Eng 6th Sem BTEUP Diploma Syllabus 2017 Subjects. For all other elective subjects do refer to Electives. The detail syllabus for electronics equipment testing is as follows.
1. FAMILIARISATION WITH ELECTRONIC TEST EQUIPMENT :
DC Meters, AC Meters, Electronic Multimeters, DC Bridges, AC Bridges, Universal Bridge, Low Frequency Power Measuring Instruments, High Frequency Power Measuurments, Wave Meters, General Purpose Oscilloscopes, Storage Oscilloscope, Specrum Analyzer, AF Signal Generator, RF Signal Generator, Television Signal Generators, Logic Analyzer, Signature Analyser, Transistor Tester, CRD with Component Testing Facility.
2. INSTRUMENTS ACCESSORIES :
Attenuators Decade resistors, Decade capacitors and Inductors, Dummy loads, Instruments, Probes, Delay lines.
3. TESTING PRACTICES :
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4. MEASURING TECHNIQUES :
Rotation and vibration frequencies, Audio and Radio frequency, Phase relationship, Interpreting displays spectra measurement measuring amplitude modulations, Frequency modulation field intencity.
5. TESTING OF DESCREATE SEMICONDUCTOR, AMPLIFIERS AND OTHER
Types of semiconductor devices, Testing of diodes, Zener diode, Varactor diode curve trace for testing transistors, Testing miscellaneous solid state componentes. Typical OpAmp. circuits, Fault diagnosis in Op-Amp circuits. Testing of voltage regulater ICs, Testing other linear integrated circuits. Solid State Oscillator bias problems, Affect of resistance and cold solder joints, Localising trouble to a circuit, locating a specific trouble testing of power supplies and SMPS.
6. TESTING OF DIGITAL AND MICROPROCESSOR DEVICES :
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7. TESTING OF MICROCOMPUTER :
System board, Keyboard, Monitors, Printers, Memory Chips Processors.
8. INTERFACE AND CABLING ENVENTIONS :
The RS-232C serial data standard, Modem cables, Monitor adaptor cables, Printer cables, IEEE-488 cable connections.
9. Basic concepts of intrinically safety and flameproof equipments.
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List of Experiments:
At least 10 experiments must be perform regarding testing of instruments/equipments of different categories:-
- Measuring and Testing Equipments
- Semiconductor Devices, All types of amplfiers and ICs.
- Digital and Microprocessor devices.
- Micro-controller/Micro-computers.
NOTE : At least 2 experiment from each category of devices mentioned above.
For detail syllabus of all other subjects of BE Electronics Eng, 2017 scheme do visit Electronics Eng 6 syllabus for 2017 Scheme.
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