Materials Characterization Techniques Detailed Syllabus for B.Tech third year first sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.<\/p>\n
The detailed syllabus for Materials Characterization Techniques B.Tech 2016-2017 (R16) third year first sem is as follows.<\/p>\n
B.Tech. III Year I Sem. \u00a0 \u00a0L\/T\/P\/C
\nCourse Code: MM511OE \u00a0\u00a03\/0\/0\/3<\/p>\n
Course Objective:<\/strong> This course is intended to give an exposure to evaluation of special\u00a0characteristics of materials (Structural, Mechanical & Thermal etc.) in order to understand\u00a0their suitability in Engineering Applications<\/p>\n Course Outcome:<\/strong> At the end of the course the student will be able to characterize, identify,\u00a0and apply the material to the concerned application.<\/p>\n UNIT-I :\u00a0X-Ray Diffraction:<\/strong> Introduction, Production and properties of x-rays, Bragg\u2019s law of UNIT-II :\u00a0Elements of Quantitative Metallography and Image Processing.<\/strong>\u00a0Scanning Electron Microscopy: Principle, Interaction of electron beams with matter,\u00a0Construction and Working principle Scanning Electron Microscopy, Working Distance,\u00a0Depth of field, Depth of focus and Spot Size, Specimen preparation for Scanning Electron\u00a0Microscopy, Different types of modes used in Scanning Electron Microscopy (Secondary\u00a0Electron and Backscatter Electron) and their applications, Advantages, limitations and\u00a0applications of Scanning Electron Microscopy, Electron Backscattered Diffraction.<\/p>\n UNIT-III:\u00a0Transmission Electron Microscopy:<\/strong> Principle, Construction and Working principle of
\ndiffraction. Experimental Methods of Diffraction, Intensity of Diffracted beams – Scattering\u00a0by an electron by an atom, by a unit cell, structure-factor calculations; factors affecting\u00a0Diffraction Intensities.
\nApplication of XRD: Orientation of single crystals, Effect of plastic deformation, the\u00a0structure of polycrystalline Aggregates, Determination of crystal structure, Precise lattice\u00a0parameter measurements, Phase – diagram determination, Order-disorder transformation,\u00a0Chemical analysis by Diffraction, Stress measurement<\/p>\n
\nTransmission Electron Microscopy, Resolving power and Magnification, Depth of field and\u00a0Depth of focus, Bright and dark field, Specimen preparation for the Transmission Electron\u00a0Microscopy: Selected Area Diffraction, Applications of Transmission Electron Microscopy,\u00a0Advantage and Limitations of Transmission Electron Microscopy.<\/p>\n