{"id":29346,"date":"2021-08-29T14:35:47","date_gmt":"2021-08-29T14:35:47","guid":{"rendered":"https:\/\/www.inspirenignite.com\/jntuh\/ec822pe-test-and-testability-ece-syllabus-for-btech-4th-year-2nd-sem-r18-regulation-jntuh-professional-elective-6\/"},"modified":"2021-08-29T14:35:47","modified_gmt":"2021-08-29T14:35:47","slug":"ec822pe-test-and-testability-ece-syllabus-for-btech-4th-year-2nd-sem-r18-regulation-jntuh-professional-elective-6","status":"publish","type":"post","link":"https:\/\/www.inspirenignite.com\/jntuh\/ec822pe-test-and-testability-ece-syllabus-for-btech-4th-year-2nd-sem-r18-regulation-jntuh-professional-elective-6\/","title":{"rendered":"EC822PE: Test and Testability ECE Syllabus for B.Tech 4th Year 2nd Sem R18 Regulation JNTUH (Professional Elective-6)"},"content":{"rendered":"<p align=\"justify\">Test and Testability detailed syllabus for Electronics &amp; Communication Engineering (ECE), R18 regulation has been taken from the <a class=\"rank-math-link\" href=\"https:\/\/jntuh.ac.in\/syllabus\/\" style=\"color: inherit\" target=\"_blank\" rel=\"noopener\">JNTUHs<\/a> official website and presented for the students of B.Tech Electronics &amp; Communication Engineering branch affiliated to JNTUH course structure. For Course Code, Course Titles, Theory Lectures, Tutorial, Practical\/Drawing, Credits, and other information do visit full semester subjects post given below. The syllabus PDF files can also be downloaded from the universities official website.<\/p>\n<p align=\"justify\">For all the other ECE 4th Year 2nd Sem Syllabus for B.Tech R18 Regulation JNTUH scheme, visit <a class=\"rank-math-link\" href=\"..\/ece-4th-year-2nd-sem-syllabus-for-btech-r18-regulation-jntuh\">Electronics &amp; Communication Engineering 4th Year 2nd Sem R18 Scheme<\/a>. <\/p>\n<p align=\"justify\">For all the (Professional Elective-6) subjects refer to <a class=\"rank-math-link\" href=\"..\/ece-4th-year-2nd-sem-professional-elective-6-syllabus-for-btech-r18-regulation-jntuh\">Professional Elective-6 Scheme<\/a>. The detail syllabus for test and testability is as follows.  <\/p>\n<h4>Prerequisite:<\/h4>\n<p>  Switching Theory and Logic Design, Digital System Design with PLDS<\/p>\n<h4>Course Objective:<\/h4>\n<p id=\"istudy\" style=\"text-align:center\">For the complete syllabus, results, class timetable, and many other features kindly download the <a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" target=\"_blank\" rel=\"noopener\">iStudy App<\/a><br \/><b> It is a lightweight, easy to use, no images, and no pdfs platform to make students&#8217;s lives easier.<\/b><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&amp;pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px\"><\/a>.  <\/p>\n<h4>Course Outcome:<\/h4>\n<p>  On completion of this course the student will be able to:<\/p>\n<ul>\n<li>To acquire the knowledge of fundamental concepts in fault and fault diagnosis<\/li>\n<li>Test pattern generation using LFSR and CA<\/li>\n<li>Design for testability rules and techniques for combinational circuits<\/li>\n<li>Introducing scan architectures<\/li>\n<\/ul>\n<h4>Unit &#8211; I<\/h4>\n<p>  Need for testing, the problems in digital Design testing, the problems in Analog Design testing, the problems in mixed analog\/digital design testing, design for test, printed-circuit board (PCB) testing, software testing, Fault in Digital Circuits: General Introduction, Controllability and Observability, Fault Models, stuck at faults, bridging faults, CMOS technology considerations, intermittent faults.<\/p>\n<h4>Unit &#8211; II<\/h4>\n<p id=\"istudy\" style=\"text-align:center\">For the complete syllabus, results, class timetable, and many other features kindly download the <a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" target=\"_blank\" rel=\"noopener\">iStudy App<\/a><br \/><b> It is a lightweight, easy to use, no images, and no pdfs platform to make students&#8217;s lives easier.<\/b><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&amp;pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px\"><\/a>.  <\/p>\n<h4>Unit &#8211; III<\/h4>\n<p>  Pseudorandorn test pattern generators, Design of test pattern generator usingLinear feedback shift registers (LFSRs) and cellular automata(CAs).<\/p>\n<h4>Unit &#8211; IV<\/h4>\n<p>  Design for Testability for combinational circuits: Basic Concepts of testability, controllability and observability, the Reed Muller\u00ef\u00bf\u00bds expansion techniques, use of control logic and syndrome testable designs.<\/p>\n<h4>Unit &#8211; V<\/h4>\n<p id=\"istudy\" style=\"text-align:center\">For the complete syllabus, results, class timetable, and many other features kindly download the <a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" target=\"_blank\" rel=\"noopener\">iStudy App<\/a><br \/><b> It is a lightweight, easy to use, no images, and no pdfs platform to make students&#8217;s lives easier.<\/b><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&amp;pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px\"><\/a>.  <\/p>\n<h4>Text Books:<\/h4>\n<ol>\n<li>Fault Tolerant and Fault Testable Hardware Design-Parag K. Lala, 1984, PHI.<\/li>\n<li>VLSI Testing digital and Mixed analogue\/digital techniques-Stanley L. Hurst, IEE Circuits, Devices and Systems series 9, 1998.<\/li>\n<\/ol>\n<h4>Reference Books:<\/h4>\n<p id=\"istudy\" style=\"text-align:center\">For the complete syllabus, results, class timetable, and many other features kindly download the <a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" target=\"_blank\" rel=\"noopener\">iStudy App<\/a><br \/><b> It is a lightweight, easy to use, no images, and no pdfs platform to make students&#8217;s lives easier.<\/b><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&amp;pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px\"><\/a>.<\/p>\n<p align=\"justify\">For detail syllabus of all other subjects of B.Tech Electronics &amp; Communication Engineering 4th Year 2nd Sem , visit <a class=\"rank-math-link\" href=\"..\/category\/ece\">ECE 4th Year 2nd Sem syllabus<\/a> subjects.<\/p>\n<p align=\"justify\">For B.Tech Electronics &amp; Communication Engineering (ECE) 4th  Year results, visit <a class=\"rank-math-link\" href=\"https:\/\/www.inspirenignite.com\/jntuh\/jntuh-b-tech-results\/\">JNTUH B.Tech Electronics &amp; Communication Engineering semester results<\/a> direct link.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Test and Testability detailed syllabus for Electronics &amp; Communication Engineering (ECE), R18 regulation has been taken from the JNTUHs official website and presented for the students of B.Tech Electronics &amp; [&hellip;]<\/p>\n","protected":false},"author":2344,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_bbp_topic_count":0,"_bbp_reply_count":0,"_bbp_total_topic_count":0,"_bbp_total_reply_count":0,"_bbp_voice_count":0,"_bbp_anonymous_reply_count":0,"_bbp_topic_count_hidden":0,"_bbp_reply_count_hidden":0,"_bbp_forum_subforum_count":0,"footnotes":""},"categories":[3],"tags":[],"class_list":["post-29346","post","type-post","status-publish","format-standard","hentry","category-ece"],"_links":{"self":[{"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/posts\/29346","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/users\/2344"}],"replies":[{"embeddable":true,"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/comments?post=29346"}],"version-history":[{"count":0,"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/posts\/29346\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/media?parent=29346"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/categories?post=29346"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.inspirenignite.com\/jntuh\/wp-json\/wp\/v2\/tags?post=29346"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}