Quality and Reliability Engineering Detailed Syllabus for Electronics & Instrumentation M.Tech first year second sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Quality and Reliability Engineering M.Tech 2017-2018 (R17) first year second sem is as follows.
M.Tech. I Year II Sem.
UNIT – I : Elements of Probability Theory Probability Distributions: Random variables, density and distribution functions, Mathematical expectation, Binominal distribution, Poisson distribution, Normal distribution, Exponential distribution, Weibull distribution. Reliability: Definition of Reliability, Significance of the terms appearing in the definition, Component reliability, Hazard rate, Derivation of the reliability functions in terms of the hazard rate, Hazard models.
UNIT – II : Failures: Causes of failures, Types of failures (early failures, chance failures and wear-out failures), Modes of failure, Bath tub curve, Effect of preventive maintenance. Measures of Reliability: Mean Time to Failure (MTTF) and Mean Time between Failures (MTBF).
UNIT – III : Reliability Logic Diagrams(reliability block diagrams): Classification of engineering systemsSeries, Parallel, Series-Parallel, Parallel-Series and non-series-parallel configurations (mainly for Electronic system configurations), Expressions for the reliability of the basic (Electronic Systems) configurations.
UNIT – IV : Reliability Evaluation of Non-Series-Parallel Configurations (Mainly for Electronic Systems Configurations): Minimal tie-set, Minimal cut-set and decomposition methods, Deduction of the minimal cut sets from the minimal path sets. More than Two Components Electronics Systems Reliability Evaluation: Series systems, Parallel systems with two and more than two components, Network reduction techniques, Minimal cutest / failure mode approach.
UNIT – V : Discrete Markov Chains: General modelling concepts, Stochastic transitional probability matrix, Aime dependent probability evaluation and limiting state probability evaluation, absorbing states (mainly for Electronic systems). Continuous Markov Processes: Modelling concepts, State space diagrams, Stochastic Transitional Probability Matrix, Evaluating limiting state Probabilities, Reliability evaluation of repairable systems (mainly for Electronic systems).
TEXT BOOKS:
- Roy Billinton and Ronald N Allan, “Reliability Evaluation of Engineering Systems”, Plenum Press.
- Elsayed A. Elsayed, “Reliability Engineering”, Prentice Hall Publications.
REFERENCE BOOKS:
- Alessandro Birolini, “Reliability Engineering: Theory and Practice”, Springer Publications.
- E. Balaguruswamy, “Reliability Engineering”, TMH Publications
For all other M.Tech 1st Year 2nd Sem syllabus go to JNTUH M.Tech Electronics & Instrumentation 1st Year 2nd Sem Course Structure for (R17) Batch.
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