M.Tech, Syllabus

JNTUH M.Tech 2017-2018 (R17) Detailed Syllabus Intelligent Instrumentation And Manufacturing

Intelligent Instrumentation And Manufacturing Detailed Syllabus for Automation M.Tech first year second sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.

The detailed syllabus for Intelligent Instrumentation And Manufacturing M.Tech 2017-2018 (R17) first year second sem is as follows.

M.Tech. I Year II Sem.

UNIT- I : Introduction – Introduction of intelligent instrumentation, Historical Perspective, Current status, software based instruments. Virtual Instrumentation: Introduction to graphical programming, data flow & graphical programming techniques, advantage of VI techniques, VIs and sub VIs loops and charts, arrays, clusters and graphs, case and sequence structure, formula nodes, string and file I/O Code Interface Nodes and DLL links.

UNIT- II : Data Acquisition Method, Analog and Digital IO, Counters, Timers, Basic ADC design, interfacing methods of DAQ hardware, software structure, .use of simple and intermediate Vis. Use of Data Sockets for Networked communication and controls.

UNIT- III : PC Hardware Review and Instrumentation Buses, Structure, timing, interrupts, DMA, operating system, ISA, PCI, USB, PCMCIA Buses. IEEE488.I & 488.2 serial Interfacing -RS 232C, RS422, RS423, RS485, USB, VXI, SCXI, P3JJ.

UNIT- IV : Analysis Techniques: DSP software, Measurement, filters and wavelets, windows, curve fitting probability & statistics.
Communication: Basis networking methods and their applications in instrumentation, use of Data sockets for distributed control.

UNIT-V : Components of Knowledge Based Systems: Basic components of knowledge based system, knowledge Representation, comparison of knowledge Representation Schems, Interference Engine, knowledge acquisition Machine Learning – concept of Artificial intelligence, conceptual learning, Artificial Neural Networks – Biological Neuron, Artificial Neuron, types of Neural Networks^ applications in manufacturing.

REFERENCES:

  • Intelligent Instrumentation/ G.C. Barney/Prentice Hall, 1995ce:
  • Lab VIEW For everyone/ Lisa, K. Wells & Jeffery Travis/ Prentice Hall, 1997
  • Principles of measurement and Instrumentation/ A.S. Morris/Prentice Hall, 1993.
  • P.C. Interfacing for data Acquisition & Process Control/ S. Gupta/, 2nd Edition/Instrument Society of America, 1994
  • Lab VIEW Graphical Programming/ Gray Johnson/ 2nd Edition/Tata Mc Graw Hill, 1997

For all other M.Tech 1st Year 2nd Sem syllabus go to JNTUH M.Tech Automation  1st Year 2nd Sem Course Structure for (R17) Batch.

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