Computer Aided Metrology & Machine Vision Detailed Syllabus for Mechatronics M.Tech first year second sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Computer Aided Metrology & Machine Vision M.Tech 2017-2018 (R17) first year second sem is as follows.
M.Tech. I Year II Sem.
UNIT – I : Coordinate Measuring Machine: Evaluation of Measurement-Coordinate Measuring Machines- nonCartesian CMMs- Accessory elements- Application software- Performance evaluations- Temperature fundamentals- Environmental control- Accuracy enhancement- Applications –Measuring integration of CMM and computers.
UNIT – II : Laser in Measurements: Laser source- Types, Characteristics and its application in measurement, – LASER Inter ferometer for measurement of flatness and displacement- LASER alignment- LASER micrometer- Tool wear online and in process measurement of diameter, Roundness measurement using LASER- Opto-Electric devices- Contact and non-contact types- Application of online and in process monitoring systems.
UNIT – III : Quality Control & Quality Assurance: In-process inspection and online sensing, Automated inspection techniques total Quality Control (TQC)- Quality Assurance (QA)- POKA-YOKE statistical evaluation of data using computer, Total Quality Management(TQM)
UNIT – IV : Machine Vision and its Application: Shape identification –edge detecting techniques Normalization- gray scale correction- template techniques- measurement of length and diameters, surface roughness using machine vision system- interfacing Robot and machine vision system Industrial applications.
UNIT – V : Statistical Process Control: Introduction, Objectives, setting control limits, Real Time Control Charts, control limits, Bell curve distribution.
REFERENCE BOOKS:
- Computers as Components, Principles of Embedded Computers Systems Design, Wayne Wolf Morgan
- J. Watson, Opto- electronics, Van Nostrand, Reinhold (UK) Co. Ltd, 1988
- Taguchi. G. L Syed et al. Quality Engineering in product Systems, McGraw Hill, 1980
- John bank, : Essence of TQM, Prentice Hall of India Pvt, 1990
- Machining and CNC Technology – Michael Fitz Patrick, McGraw Hill Publication.
For all other M.Tech 1st Year 2nd Sem syllabus go to JNTUH M.Tech Mechatronics 1st Year 2nd Sem Course Structure for (R17) Batch.
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