Advanced GIS System Detailed Syllabus for Geo-Informatics and Surveying Technology M.Tech first year second sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.
The detailed syllabus for Advanced GIS M.Tech 2017-2018 (R17) first year second sem is as follows.
M.Tech. I Year II Sem.
Course Objective: to understand the spatial analysis and modeling using/with GIS
Course Outcome: At the end of the course the student will able to learn spatial analysis using GIS, surface mapping, spatial arrangement of data of different types and modeling of the given system in a space frame.
UNIT – I: Elementary Spatial Analysis – Introduction to GIS Spatial Analysis, A Simple Analysis Framework, How the GIS Finds Objects, Why We Need to Find and Locate Objects, Defining Objects Based on Their Attributes, Defining Point Objects Based on Their Attributes, Defining Line Objects Based On Their Attributes, Defining Area Objects Based on Their Attributes, Higher Level Point Objects, Higher Level Line Objects, Higher Level Area Objects,
UNIT – II: Measurement – Measuring Length of Linear Objects, Measuring Polygons, Calculating Polygon Lengths, Calculating Perimeter, Calculating Area of Polygonal Features, Measuring Shape, Measuring Sinuosity, Measuring Polygon Shape, Measuring Distance, Functional Distance, Classification – Neighborhood Functions, Roving windows, Polygonal neighborhoods, Terrain reclassification, Buffers,
Unit – III: Statistical Surfaces – Surface Mapping, Sampling the Statistical Surface, The Digital Elevation Model 9DEM), Raster Surface, Interpolation, Linear Interpolation, Methods of Nonlinear Interpolation, Uses of Interpolation, Problems in Interpolation , Slicing the Statistical Surface, Cut and Fill Discrete Surfaces, Dot Distribution Maps, Choropleth Maps.
Unit – IV: Spatial Arrangement – Point Patterns – Quadrate Analysis, Nearest Neighbor Analysis, Theissen Polygons, Area patterns, Linear Patterns – Line Densities, Nearest Neighbors and Line Intercepts, Directionality of Linear and Areal Objects, Connectivity of Linear Objects, Gravity Model, Routing and Allocation.
Unit – V : Overlay and Cartographic modeling – Cartographic Overlay, Point-in-Polygon and Line-in-Polygon, Polygon Overlay, Automating Point-in-Polygon and Line-in-Polygon in Raster, Automating Polygon Overlay in Raster, Automating Vector Overlay, Types of Overlay, CAD-Type Overlay, Topological Vector Overlay, Topological Vector Point-in-polygon and Line-in-polygon Overlay, Vector Polygon overlay. Types of Cartographic Models, Inductive and Deductive Modeling, Model Flowcharting, Working through the model, Conflict Resolution, Examples Cartographic Models, Model Implementation.
TEXT BOOKS:
- Fundamental of GIS by MICHAEL N DEMERS – MN DEMERS, Published by John Wiley & Sons Inc
- Introduction to GIS by Kang-tsung Chang-, published by Mc Graw Hill Education
REFERENCES:
- Geographic Information System- An Introductory – Jeffrey Star and John Estates
- Basic Readings in Geographic Information System – Marble, D.F and Calkins, H.W – Spad Systems Ltd
- Anji Reddy, M., (2001) Remote Sensing and Geographical Information Systems, 2nd edition, BS Publications, Hyderabad
- George Joseph,(2005) Fundamentals of Remote sensing 2nd edition , University press, Pvt, Ltd, Hyderabad
- Principles of GIS by P.A. Burrough, Rachael Mc Donnell
- Principles of Geographical Information Systems for Land Resources Assessment by P.A. Burrough
For all other M.Tech 1st Year 2nd Sem syllabus go to JNTUH M.Tech Geo-Informatics and Surveying Technology 1st Year 2nd Sem Course Structure for (R17) Batch.
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