{"id":56771,"date":"2023-08-28T17:02:53","date_gmt":"2023-08-28T17:02:53","guid":{"rendered":"https:\/\/www.inspirenignite.com\/anna-university\/cec361-validation-and-testing-technology-syllabus-for-ete-2021-regulation-professional-elective-i\/"},"modified":"2023-08-28T17:02:53","modified_gmt":"2023-08-28T17:02:53","slug":"cec361-validation-and-testing-technology-syllabus-for-ete-2021-regulation-professional-elective-i","status":"publish","type":"post","link":"https:\/\/www.inspirenignite.com\/anna-university\/cec361-validation-and-testing-technology-syllabus-for-ete-2021-regulation-professional-elective-i\/","title":{"rendered":"CEC361: Validation and Testing Technology syllabus for ETE 2021 regulation (Professional Elective-I)"},"content":{"rendered":"

Validation and Testing Technology detailed syllabus for Electronics & Telecommunication Engineering (ETE) for 2021 regulation curriculum has been taken from the Anna Universities<\/a> official website and presented for the ETE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below. <\/p>\n

For Electronics & Telecommunication Engineering 5th Sem scheme and its subjects, do visit ETE 5th Sem 2021 regulation scheme<\/a>. For Professional Elective-I scheme and its subjects refer to ETE Professional Elective-I syllabus scheme<\/a>. The detailed syllabus of validation and testing technology is as follows. <\/p>\n

Course Objectives:<\/h4>\n

Download the iStudy App for all syllabus and other updates.<\/a>
\"Get<\/a><\/h4>\n

Unit I<\/h4>\n

TECHNOLOGY INTRODUCTION:
\nIntroduction to IC Technology – MOS, PMOS, NMOS, CMOS & BiCMOS Technologies. VLSI Fabrication, Oxidation, Lithography, Diffusion, Ion Implantation, Metallization, Integrated Resistors and Capacitors.\n<\/p>\n

Unit II<\/h4>\n

MOS THEORY ANALYSIS-I
\nBasic Electrical Properties of MOS Circuits: Ids-Vds Relationships, MOS Transistor Threshold Voltage Vth, gm, gds, Figure of Merit wo, Short Channel and Narrow Channel Width Effects.\n<\/p>\n

Unit III<\/h4>\n

Download the iStudy App for all syllabus and other updates.<\/a>
\"Get<\/a><\/h4>\n

Unit IV<\/h4>\n

CMOS CIRCUIT CHARACTERISATION AND PERFORMANCE ESTIMATION 6
\nSheet Resistance RS, conductivity and its Concept to MOS, Area Capacitance Units, Calculations -Delays, Driving Large Capacitive Loads, Delay Estimation, Logical Effort and Transistor Sizing, Power Dissipation, Reliability.\n<\/p>\n

Unit V<\/h4>\n

BASIC OF SILICON VALIDATION
\nNeed for Testing, Testing at Various Levels, Objectives of Testing – VLSI Test process and Test Equipment – Types of Testing: Functionality Tests, Silicon Debug, Manufacturing Tests, Defect during manufacturing – Fault Modelling, Observability and Controllability, Fault Coverage, Fault Sampling – ATE, Test economics.\n<\/p>\n

Practical Exercises<\/h4>\n
    \n
  1. MOS TESTING for Ids-Vds Relationships<\/li>\n
  2. MOSFET testing for threshold voltage like Vth, gate breakdown voltage.<\/li>\n
  3. Sheet resistivity measurement.<\/li>\n
  4. Conductivity measurement.<\/li>\n
  5. Inverter testing<\/li>\n
  6. Designing of CMOS inverter\/ logic gate and testing of delay estimation.<\/li>\n<\/ol>\n

    List of equipment needed<\/i><\/p>\n