{"id":53770,"date":"2023-04-08T06:13:05","date_gmt":"2023-04-08T06:13:05","guid":{"rendered":"https:\/\/www.inspirenignite.com\/anna-university\/cec342-mixed-signal-ic-design-testing-syllabus-for-ece-2021-regulation-professional-elective-i\/"},"modified":"2023-04-08T06:13:05","modified_gmt":"2023-04-08T06:13:05","slug":"cec342-mixed-signal-ic-design-testing-syllabus-for-ece-2021-regulation-professional-elective-i","status":"publish","type":"post","link":"https:\/\/www.inspirenignite.com\/anna-university\/cec342-mixed-signal-ic-design-testing-syllabus-for-ece-2021-regulation-professional-elective-i\/","title":{"rendered":"CEC342: Mixed Signal IC Design Testing syllabus for ECE 2021 regulation (Professional Elective-I)"},"content":{"rendered":"

Mixed Signal IC Design Testing detailed syllabus for Electronics & Communication Engineering (ECE) for 2021 regulation curriculum has been taken from the Anna Universities<\/a> official website and presented for the ECE students. For course code, course name, number of credits for a course and other scheme related information, do visit full semester subjects post given below. <\/p>\n

For Electronics & Communication Engineering 5th Sem scheme and its subjects, do visit ECE 5th Sem 2021 regulation scheme<\/a>. For Professional Elective-I scheme and its subjects refer to ECE Professional Elective-I syllabus scheme<\/a>. The detailed syllabus of mixed signal ic design testing is as follows. <\/p>\n

Mixed Signal IC Design Testing<\/title><\/p>\n<h4>Course Objectives:<\/h4>\n<h4 id=\"istudy\" style=\"text-align:center\"><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" style=\"color: inherit\" target=\"_blank\" rel=\"noopener\">Download the iStudy App for all syllabus and other updates.<\/a><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px;text-align:center\"><\/a><\/h4>\n<h4>Unit I<\/h4>\n<p> <strong>MIXED – SIGNAL TESTING 6<\/strong> Common Types of Analog and Mixed- Signal Circuits – Applications of Mixed-Signal Circuits – PostSilicon Production Flow – Test and Packing – Characterization versus Production Testing – Test and Diagnostic Equipment – Automated Test Equipments – Wafer Probers – Handlers – E-Beam Probers – Focused Ion Beam Equipments – Forced -Temperature<\/p>\n<h4>Unit II<\/h4>\n<h4 id=\"istudy\" style=\"text-align:center\"><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" style=\"color: inherit\" target=\"_blank\" rel=\"noopener\">Download the iStudy App for all syllabus and other updates.<\/a><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px;text-align:center\"><\/a><\/h4>\n<h4>Unit III<\/h4>\n<p> <strong>DAC TESTING 6<\/strong> Basics of Data Converters -Principles of DAC and ADC Conversion, Data Formats, Comparison of DACs and ADCs, DAC Failure Mechanisms – Basic DC Tests – Transfer Curve Tests – Dynamic DAC Tests – Tests for Common DAC Applications<\/p>\n<h4>Unit IV<\/h4>\n<h4 id=\"istudy\" style=\"text-align:center\"><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" style=\"color: inherit\" target=\"_blank\" rel=\"noopener\">Download the iStudy App for all syllabus and other updates.<\/a><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px;text-align:center\"><\/a><\/h4>\n<h4>Unit V<\/h4>\n<p> <strong>CLOCK AND SERIAL DATA COMMUNICATIONS CHANNEL MEASUREME 6<\/strong> Synchronous and Asynchronous Communications – Time-Domain Attributes of a Clock Signal -Frequency-Domain Attributes of a Clock Signal – Communicating Serially Over a Channel – Bit Error Rate Measurement – Methods to Speed Up BER Tests in Production – Deterministic Jitter Decomposition – Jitter Transmission Tests.<\/p>\n<h4>Course Outcomes:<\/h4>\n<h4 id=\"istudy\" style=\"text-align:center\"><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy\" style=\"color: inherit\" target=\"_blank\" rel=\"noopener\">Download the iStudy App for all syllabus and other updates.<\/a><br \/><a class=\"rank-math-link\" href=\"https:\/\/play.google.com\/store\/apps\/details?id=ini.istudy&pcampaignid=pcampaignidMKT-Other-global-all-co-prtnr-py-PartBadge-Mar2515-1\" target=\"_blank\" rel=\"noopener\"><img decoding=\"async\" src=\"https:\/\/play.google.com\/intl\/en_us\/badges\/static\/images\/badges\/en_badge_web_generic.png\" alt=\"Get it on Google Play\" style=\"height:65px;text-align:center\"><\/a><\/h4>\n<h4>Text Books:<\/h4>\n<ol>\n<li>Gordon W.Roberts, Friedrich Taenzler, Mark Burns, An Introduction to Mixed-signal IC Test and Measurement Oxford University Press, Inc.2012 (Unit I – V)<\/li>\n<li>M.L.Bushnell and V.D.Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Kluwer Academic Publishers, 2002. (Unit – III)<\/li>\n<li>BapirajuVinnakota, Analog and mixed-signal test, Prentice Hall, 1998.(Unit – II)<\/li>\n<li>Digital and Analogue Instrumentation: Testing and Measurement by NihalKularatna<\/li>\n<\/ol>\n<h4>Practical Exercises:<\/h4>\n<p> DESIGN AND TESTING OF THE FOLLOWING CIRCUITS<\/p>\n<ol>\n<li>PLL characteristics and its use as Frequency Multiplier, Clock synchronization<\/li>\n<li>R-2R Ladder Type and Flash Type ADC.<\/li>\n<li>DC power supply using LM317 and LM723.<\/li>\n<li>Design of asynchronous counter<\/li>\n<li>Design of synchronous counter<\/li>\n<li>Implementation and Testing of RS Latch and Flip-flops<\/li>\n<\/ol>\n<p align=\"justify\">For detailed syllabus of all the other subjects of Electronics & Communication Engineering 5th Sem, visit <a class=\"rank-math-link\" href=\"..\/category\/ece+5th-sem\">ECE 5th Sem subject syllabuses for 2021 regulation<\/a>. <\/p>\n<p align=\"justify\">For all Electronics & Communication Engineering results, visit <a class=\"rank-math-link\" href=\"https:\/\/www.inspirenignite.com\/anna-university\/anna-university-results\/\">Anna University ECE all semester results<\/a> direct link. <\/p>\n","protected":false},"excerpt":{"rendered":"<p>Mixed Signal IC Design Testing detailed syllabus for Electronics & Communication Engineering (ECE) for 2021 regulation curriculum has been taken from the Anna Universities official website and presented for the […]<\/p>\n","protected":false},"author":2297,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_bbp_topic_count":0,"_bbp_reply_count":0,"_bbp_total_topic_count":0,"_bbp_total_reply_count":0,"_bbp_voice_count":0,"_bbp_anonymous_reply_count":0,"_bbp_topic_count_hidden":0,"_bbp_reply_count_hidden":0,"_bbp_forum_subforum_count":0,"footnotes":""},"categories":[71],"tags":[],"class_list":["post-53770","post","type-post","status-publish","format-standard","hentry","category-ece"],"_links":{"self":[{"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/posts\/53770","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/users\/2297"}],"replies":[{"embeddable":true,"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/comments?post=53770"}],"version-history":[{"count":0,"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/posts\/53770\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/media?parent=53770"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/categories?post=53770"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.inspirenignite.com\/anna-university\/wp-json\/wp\/v2\/tags?post=53770"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}