Characterization of Materials Syllabus for B.Tech 5th sem is covered here. This gives the details about credits, number of hours and other details along with reference books for the course.<\/p>\n
The detailed syllabus for Characterization of Materials B.Tech (R13) fifthsem is as follows<\/p>\n
OBJECTIVES<\/strong>:<\/p>\n Characterisation of materials is very important for studying the structure of materials and to interprettheir properties. The students study the theoretical foundations of metallography, X- ray diffraction, electron diffraction, scanning and transmission electron microscopy as well as surface analysis<\/p>\n UNIT I : METALLOGRAPHIC TECHNIQUES<\/strong> \u00a0 \u00a0[8 Hours] UNIT II : X-RAY DIFFRACTION TECHNIQUES \u00a0<\/strong> \u00a0\u00a0[10 Hours] UNIT III : ANALYSIS OF X-RAY DIFFRACTION<\/strong> \u00a0 \u00a0\u00a0[9 Hours]
\nMacro examination – applications, metallurgical microscope – principle, construction and working, metallographic specimen preparation, optic properties – magnification, numerical aperture, resolving power, depth of focus, depth of field, different light sources lenses aberrations and their remedial measures, various illumination techniques-bright field , dark field, phase contrast polarized light illuminations, interference microscopy, high temperature microscopy; quantitative metallography \u2013 Image analysis<\/p>\n
\nCrystallography basics, reciprocal lattice, X-ray generation, absorption edges, characteristic spectrum, Bragg\u2019s law, Diffraction methods \u2013 Laue, rotating crystal and powder methods. Stereographic projection. Intensity of diffracted beams \u2013 structure factor calculations and other factors. Cameras- Laue, Debye-Scherer cameras, Seeman – Bohlin focusing cameras. Diffractometer \u2013 General feature and optics, proportional, Scintillating and Geiger counters.<\/p>\n
\nLine broadening, particle size, crystallite size, Precise parameter measurement, Phase identification, phase quantification, Phase diagram determination X-ray diffraction application in the determination of crystal structure, lattice parameter, residual stress \u2013 quantitative phase estimation, ASTM catalogue of Materials identification-<\/p>\n